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Issue DateTitleAuthor(s)
2023Patenting in Biotechnology (18M11BT114) T-2 October, 2023 (Sem-1) Ph.D._M.Tech BT-
2020Patents and Prior ArtsRasraj, Shivam
2008Path Follower Robotic Car using RF TagSaxena, Khushboo; Malviya, Sachin; Prasad, Ankita; Sharma, Neeru [Guided by]
2018The path forward for lignocellulose biorefineries: Bottlenecks, solutions, and perspective on commercializationChandel, Anuj Kumar; Garlapati, Vijay Kumar; Singh, Akhilesh Kumar; Antunesa, Felipe Antonio Fernandes; Silva, Silvio Silvério da
2016Path Planning for Autonomous Mobile RobotsSaurabh, Saumya; Raghav, Jayesh; Kumar, Rajiv [Guided by]
2020Path-Based Recovery Scheme for a Failure in Elastic Optical NetworksKumar, Dinesh; Kumar, Rajiv; Sharma, Neeru
2022Pathfinding VisualizerSharma, Meenakshi; Jindal, Himanshu [Guided By]
2016Pathophysiology (10B11PY515) Term-End July, 2016 (Sem 5) B.Pharm-
2011Patient Monitoring and Care SystemGulhar, Abhinav; Barar, Prateek; Sharma, Neeru [Guided by]
2006Pattern Analysis and its Application in Weather ForecastingKumar, Mahendra; Sehgal, Vivek Kumar[Guided by]
2023Pattern Analysis in Machine Intelligence (19B1WEC732) T-1 September, 2023 (Sem-7)ECE-
2022Pattern Analysis in Machine Intelligence (19B1WEC732) T-1, September 2022 (Sem-7) ECE-
2022Pattern Analysis in Machine Intelligence (19B1WEC732) T-2 October, 2022 (Sem-7) B. Tech (ECE)-
2023Pattern Analysis in Machine Intelligence (19B1WEC732) T-2 October, 2023 (Sem-7) ECE-
2021Pattern Analysis in Machine Intelligence (19B1WEC732) T-3 December, 2021 (Sem 7) B.Tech-
2022Pattern Analysis in Machine Intelligence (19B1WEC732) T-3 December, 2022 (Sem-7) B.Tech (ECE)-
2023Pattern Analysis in Machine Intelligence (19B1WEC732) T-3 December, 2023 (Sem-7) ECE-
2017Pattern and Anomaly Recognition in Industrial ScenariosAgarwal, Yash; Passey, Pushpak; Saini, Hemraj [Guided by]
2017Pattern and Anomaly Recognition in Industrial ScenariosAgarwal, Yash; Passey, Pushpak; Saini, Hemraj Saini [Guided by]
2017Pattern Recognition Using Neural NetworksBatr, Dhruv; Singh, Gundeep; Shukla, Achmn; Sharma, Neeru [Guided by]