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dc.contributor.authorSharma, Pankaj-
dc.contributor.authorKatyal, S.C.-
dc.contributor.authorThakur, Nagesh-
dc.descriptionJournal of Non-oxide Glasses Volume 1, No. 2, 2009, p. 90-95en_US
dc.description.abstractThin films of chemical composition Se80Te20, (Se80Te20)98Ag2, (Se80Te20)98Bi2 and (Se80Te20)98Ge2 are prepared by thermal evaporation technique. The optical properties of these thin films are determined by a method, based only on the transmission spectra at normal incidence, measured over the spectral range of 500-2500 nm. The dispersion of refractive index is discussed in terms of the single-oscillator Wemple and DiDomenico model. Optical energy gap (Eg) decreases while refractive index (n) increases on the incorporation of Bi addition in Se-Te system. On the other hand Eg increases while n and extinction coefficient (k) decreases on incorporation of Ag and Ge in Se-Te system. Results are interpreted in terms of cohesive energy (CE) and electronegativity (χ).en_US
dc.publisherJaypee University of Information Technology, Solan, H.P.en_US
dc.subjectThin filmsen_US
dc.subjectrefractive indexen_US
dc.subjectoptical energy gapen_US
dc.subjectcohesive energy.en_US
dc.titleA Study of Impurities (Ag, Bi & Ge) on the optical properties of Se-Te thin filmsen_US
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