Please use this identifier to cite or link to this item: http://ir.juit.ac.in:8080/jspui/jspui/handle/123456789/5246
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dc.contributor.authorSharma, Pankaj-
dc.contributor.authorKatyal, S. C.-
dc.date.accessioned2022-07-28T05:54:37Z-
dc.date.available2022-07-28T05:54:37Z-
dc.date.issued2004-
dc.identifier.urihttp://ir.juit.ac.in:8080/jspui//xmlui/handle/123456789/5246-
dc.descriptionJOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS Vol. 9, No. 7, July 2007, p. 2000 - 2004en_US
dc.description.abstractThin films of a-Ge10Se90-xTex (x = 0, 30, 40) glassy alloys are prepared by vacuum evaporation technique at ~10-5 Torr on cleaned glass substrate at room temperature. Optical study is performed to calculate the refractive index (n), extinction coefficient (k), optical conductivity (σ), dielectric constant (real and imaginary), absorption coefficient (α) and optical band gap ( opt g E ) using transmission spectra in the wavelength range 400-1400 nm.en_US
dc.language.isoenen_US
dc.publisherJaypee University of Information Technology, Solan, H.P.en_US
dc.subjectChalcogenide glassesen_US
dc.subjectOptical propertiesen_US
dc.subjectOptical band gapen_US
dc.subjectDefect statesen_US
dc.subjectAverage bond energyen_US
dc.titleCalculation of Optical Constants in a-Ge10Se90-xTex (x = 0,30, 40) Thin Filmsen_US
dc.typeArticleen_US
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