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dc.contributor.authorSuresh Kumar-
dc.contributor.authorSantosh Kumar-
dc.contributor.authorSharma, Pankaj-
dc.contributor.authorSharma, Vineet-
dc.contributor.authorKatyal, S. C.-
dc.descriptionJOURNAL OF APPLIED PHYSICS 112, 123512 (2012)en_US
dc.description.abstractCdS nanofilms of varying thickness (t) deposited by chemical bath deposition technique have been studied for structural changes using x-ray diffractometer (XRD) and transmission electron microscope (TEM). XRD analysis shows polycrystalline nature in deposited films with preferred orientation along (002) reflection plane also confirmed by selected area diffraction pattern of TEM. Uniform and smooth surface morphology observed using field emission scanning electron microscope. The surface topography has been studied using atomic force microscope. The optical constants have been calculated from the analysis of %T and %R spectra in the wavelength range 300 nm-900 nm. CdS nanofilms show a direct transition with red shift. The optical band gap decreases while the refractive index increases with increase in thickness of nanofilmsen_US
dc.publisherJaypee University of Information Technology, Solan, H.P.en_US
dc.subjectCdS nanofilmsen_US
dc.titleCdS Nanofilms: Effect of film thickness on morphology and optical band gapen_US
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