Please use this identifier to cite or link to this item: http://ir.juit.ac.in:8080/jspui/jspui/handle/123456789/9252
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dc.contributor.authorPatial, Balbir Singh-
dc.contributor.authorNeha-
dc.contributor.authorPrakash, Jai-
dc.contributor.authorKumar, Rajesh-
dc.contributor.authorTripathi, S.K.-
dc.contributor.authorThakur, Nagesh-
dc.date.accessioned2023-01-17T06:40:29Z-
dc.date.available2023-01-17T06:40:29Z-
dc.date.issued2013-
dc.identifier.urihttp://ir.juit.ac.in:8080/jspui/jspui/handle/123456789/9252-
dc.description.abstractIn the present study, investigations of dielectric parameters viz dielectric constant ( ), dielectric loss ( ) and AC conductivity measurements have been made for bulk chalcogenide Ge15Se85 glass in the frequency range 10 to 500 kHz within the temperature range from 300 to 390 K. The variation of dielectric constant and dielectric loss with frequency at room temperature is reported and discussed in the investigated glassy binary alloyen_US
dc.language.isoenen_US
dc.publisherJaypee University of Information Technology, Solan, H.P.en_US
dc.subjectChalcogenide semiconductorsen_US
dc.subjectDielectric constanten_US
dc.subjectDielectric lossen_US
dc.subjectAC conductivityen_US
dc.titleDielectric Properties and AC Conductivity Measurements of Amorphous Ge15Se85 Glassen_US
dc.typeArticleen_US
Appears in Collections:Journal Articles

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