Please use this identifier to cite or link to this item: http://ir.juit.ac.in:8080/jspui/jspui/handle/123456789/9255
Title: Drain current and noise model of cylindrical surrounding double-gate MOSFET for RF switch
Authors: Srivastava, Viranjay M.
Yadav, K.S
Singh, G.
Keywords: 45-nm technology
Sngle gate MOSFAT
CMOS
VLSI
Issue Date: 2012
Publisher: Jaypee University of Information Technology, Solan, H.P.
URI: http://ir.juit.ac.in:8080/jspui/jspui/handle/123456789/9255
Appears in Collections:Journal Articles



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